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广东省深圳市宝安区宝城67区留仙一路东甲岸科技园1号厂房4楼1区

C3局部洁净度判定仪

FORESITE公司在美国是具有权威性的专业级之检测实验室,它可提供以下专业的检测测试。

测试各式电子产品之正负离子残留值,并提供专业的检测报告。

检测方式:IPC TM 650.2.3.28 (Ionic Analysis of circuit boards,ion chrom atography method)


C3用途
Monitoring tool for production floor

Focus on sensitive area of concern (0.1 in2)
聚焦在问题的萃取面积为0.1in2


Performs electrical test and gives immediate ‘clean’ or ‘dirty’ reading based on Foresite recommended limits for ionic contamination
进行电气测试并在Foresite建议的离子污染限值基础上给予“清洁”或“污染”的清洁度判定结果


Localized extraction method for Ion Chromatography

Extracts sample from localized testing area using deionized steam
使用去离子水蒸汽萃取局部测试区的样品


Samples can be shipped to a lab for Ion Chromatography analysis
萃取后的样品直接进行IC分析


C-3测试元件操作:for IC( 离子浓度色谱分析仪)


Localized Extraction by C3 & Test per IPC-TM- 650 Standard 2.3.28
C3局部萃取法IPC-TM- 650 Standard 2.3.28


Uses D.I. Water (Steam) 使用DI水(蒸汽)

Dilution factor for I.C. is based on Cell Aperture (0.1in2)
IC的稀释因子取决于测试头的孔径(0.1in2)

Dilution factor is (2.2mL / 0.1in2 = 22)
稀释因子计算公式是 (2.2ml/0.1in2=22)

For Populated Boards add 10% (2.2mL / 0.11in2 = 20)
对于组装后的板面积需要增加10%(2.2ml/0.11in2=20)

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